45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index

Mr. Michael Tenney

Failure Analysis
IBM
Department EE9
Hopewell Junction, NY
USA 12533

Papers:

Transistor Level Reliability Assessment of Gate Oxide Defects by BTI Stress Nanoprobing
Residual EG Oxide in FinFET Analyses and Its Impact to Yield, Product Performance, and Transistor Reliability

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index
General Information

November 10 - 14, 2019


Portland, OR