45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

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Mr. Eric Barbian

Member of Technical Staff - Failure Analysis
ON Semiconductor
Quality
Phoenix, AZ
USA 85008

Papers:

Utilizing Delta IDDQ to Screen Cell Specific Defects for High Quality and Reliability Applications
Case Studies On Application Of Electro Optical Probing (EOP) - A Noninvasive Backside Localization Technique in Failure Analysis

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General Information

November 10 - 14, 2019


Portland, OR