Mr. Rommel Estores

Failure Analysis Engineer
ON Semiconductor
Quality
Oudenaarde Belgium 9700

Papers:

A New Approach to IDDQ Failure Fault Localization Using Single Shot Logic (SSL) Patterns
A Novel Approach on Fractography thru Infrared Microscopy
A Manual Diagnosis Approach Using Targeted Fault Injection and Fault Simulation to Increase the ATPG Diagnostic Resolution in Localizing Faults