Ms. Bernice Zee

Advanced Micro Devices (AMD)
Device Analysis Laboratory
Singapore Singapore

Papers:

Advanced 3D localization in Lock-In Thermography based on the analysis of the TRTR (Time-Resolved Thermal Response) received upon arbitrary waveform stimulation
Non-Destructive Short Fault Localization in Advanced IC Packages Using Electro Optical Terahertz Pulse Reflectometry