45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019):

45th International Symposium for Testing and Failure Analysis (Nov. 10-14, 2019)
November 10 - 14, 2019

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index

Prof. Kohei Yamasue

Professor
Tohoku University
Research Institute of Electrical Communication
Sendai Japan 980-8577

Papers:

Unintentional doping effects on atomically-thin Nb-doped MoS2 observed by scanning nonlinear dielectric microscopy
Carrier Profiling of the 10-nm-Order Structure in a 3D Flash Memory Cell Using Scanning Nonlinear Dielectric Microscopy

  • Home
  • Start
  • Browse
    • Browse by Day
  • At-A-Glance
  • Author Index
General Information

November 10 - 14, 2019


Portland, OR