12:00 AM
EOS/ESD Failure Mechanisms and Design Solutions
Dr. Steven Voldman, Steven H. Voldman LLC
12:00 PM
Failure Analysis of Electronic Devices
Dr. Martine Simard-Normandin, MuAnalysis Inc.
4:00 PM
Beam-Based Defect Localization
Dr. Edward I. Cole Jr., FASM, Sandia National Laboratories
8:00 PM
Optical, Infrared and FA Microscopy
Mr. John J. McDonald, Beckman Coulter, Inc. (remote position from CA)
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