Product Yield, Test & Diagnostics - POSTERS

Wednesday, November 13, 2019: 2:30 PM-4:30 PM
Exhibit Hall D (Oregon Convention Center)
Product Yield, Test & Diagnostics - POSTERS Mr. Jayant DSouza, Mentor Graphics and Mr. Amit Jakati, GLOBALFOUNDRIES
Loop transformation algorithm for test vector accessing at high speed
Mr. Bjorn Dahlberg, HiLevel Technology Inc.; Dr. Martin Versen, Technical University of Applied Sciences Rosenheim
The Investigation of Oven Contamination and Corresponding Methodology
Dr. Wen-Fei Hsieh, Ardentec Corporation
Statistical Failure Analysis for Non-parametric Characteristic in DRAM
Mr. Myunghoon Oak, Samsung Electronics
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