Sample Preparation User Group

Monday, November 11, 2019: 12:00 PM-2:00 PM
D 135/136 (Oregon Convention Center)
Sample preparation plays a critical role in failure analysis within the semiconductor industry. It has become imperative for failure analysts to remain abreast of new tools and techniques to address sample preparations on More-than-Moore (MTM) technologies.  Click HERE to visit the website for additional information. Mr. James (Jim) Colvin, FA Instruments, Mr. Pradip Sairam Pichumani, GLOBALFOUNDRIES and Dr. Nathan Bakken, PhD, Intel Corporation
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