Mr. Jonghoon Kim

Senior Engineer
Samsung Electronics
DRAM Product Engineering Team, Memory Division
Hwaseong Korea, Republic of (South) 18448

Papers:

CASE STUDIES - FA PROCESS: Cell Charge Loss by Formation of Inversion Channel in DRAM
PRODUCT YIELD, TEST & DIAGNOSTICS: A Study on the Early Detection of Metal Line Bridge Defects Using Wafer Burn-in Stress