Mr. P. K. Tan

Prinipal MTS
Globalfoundries Singapore Pte Ltd.
QRA-EFA
Singapore Singapore 738406

Papers:

Simple circuit edit passive voltage contrast technique to identify leakage location
Cross sectional passive voltage contrast approach for gate oxide breakdown defect isolation and visualization for TEM analysis
Back End of Line (BEOL) Pulse Nanoprobing Fault Isolation Technique on RF Device with Soft Failure Issue