EDFAS Virtual Workshop
December 07 - 09, 2020
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Dr. Somayyeh Rahimi
Reliability Engineer
NVIDIA
Santa Clara, CA
USA 95050
Papers:
Failure Analysis of Total-Dose Radiation-Induced Degradation on FinFET Logic ICs
Localization and Characterization of Defects for Advanced Packaging Using Novel EOTPR Probing Approach and Simulation