EDFAS Virtual Workshop
December 07 - 09, 2020
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Mr. Neel Leslie
Application Engineer
FEI Company
EFA
Fremont, CA
USA 94538
Papers:
Enabling EFA on single DIE
FIB CIRCUIT ANALYSIS AND EDIT: Influence of Dose Delivery of Low-Beam Energy STI Exposure on FinFET Devices
Addressing Failures in Advanced Packaging through a Correlative Workflow