FIB Circuit Analysis and Edit

Wednesday, December 9, 2020: 11:40 AM-12:05 PM
Mr. Antonio Tollis, Analog Devices and Dr. Daminda Dahanayaka, Globalfoundries
11:40 AM
FinFET Transistor Output Drive Performance Modification by Focused Ion Beam (FIB) Chip Circuit Editing
Mr. Steven B. Herschbein, Independent Consultant; Mr. Kyle M. Winter, GLOBALFOUNDRIES; Mr. Carmelo F. Scrudato, GLOBALFOUNDRIES; Mr. Brian Yates, GLOBALFOUNDRIES; Mr. Edward S. Hermann, GLOBALFOUNDRIES; Mr. John Carulli, GLOBALFOUNDRIES
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