Fault Isolation II

Wednesday, December 9, 2020: 3:30 PM-4:20 PM
Mr. Dan Bodoh, NXP Semiconductors and Dr. Jesse Alton, TeraView Limited
3:30 PM
Enabling EFA on single DIE
Dr. Rudolf Schlangen, NVIDIA Corporation; Chen Chih (Ronan) Chien, NVIDIA Corporation; Dr. Christopher Nemirow, NVIDIA Corporation; Eddy Yang, NVIDIA Corporation; Jiff Cheng, NVIDIA Corporation; Mr. Neel Leslie, Thermo Fisher Scientific; Prasad Sabbineni, Thermo Fisher Scientific; Dr. William Lo, NVIDIA Corporation; Mr. Howard Marks, NVIDIA Corporation
3:55 PM
Using NI-PXI Test Platform in Soft Defect Localization of Temperature Dependent Failures
Mr. Jed Paolo Lopez Deligente, Maxim Integrated Philippines; Ms. Saidaliah Laluna Sarip, Maxim Integrated Philippines
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