Nanoprobing and Electrical Characterization II

Wednesday, December 9, 2020: 3:30 PM-4:20 PM
Mr. John Sanders, Thermofisher and Mr. David Albert, IBM
3:30 PM
Electrical probing of 7nm SRAMS/SOC at contact layer
Ms. Noor Jehan Saujauddin, Carl ZEISS SMT Inc., PCS SBU; Dr. Ted Lundquist, Carl ZEISS SMT Inc., PCS SBU; Mr. Tim Niemi, Carl ZEISS SMT Inc., PCS SBU; Dr. Baohua Niu, Carl ZEISS SMT Inc., PCS SBU
3:50 PM
Nanoprobe Nodal Analysis with Stitch Diagram in Local Fault Isolation
Mr. Albert Gleason, Texas Instruments; Mr. John West, Texas Instruments; Ms. Min Xia, Synopsys
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