47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
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Focused Ion Beam (FIB) for Microchip Circuit Edit and Fault Isolation
Sunday, October 31, 2021: 12:30 PM
104 AB (Phoenix Convention Center)
Mr. Steven B. Herschbein
,
Consultant, Hopewell Junction, NY
Dr. Shida Tan
,
Intel Corporation, Santa Clara, CA
Mr. Richard H. Livengood
,
Intel Corporation, Santa Clara, CA
Mr. Michael Wong
,
Thermo Fisher Scientific, Fremont, CA
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