Featured Talks

Sunday, October 31, 2021: 12:30 PM-3:50 PM
104 AB (Phoenix Convention Center)
Mr. Lorenz Lechner, Zeiss and Mr. Corey Senowitz, Qualcomm Technologies Inc.
12:30 PM
Focused Ion Beam (FIB) for Microchip Circuit Edit and Fault Isolation
Mr. Steven B. Herschbein, Consultant; Dr. Shida Tan, Intel Corporation; Mr. Richard H. Livengood, Intel Corporation; Mr. Michael Wong, Thermo Fisher Scientific
2:20 PM
(V) 3D device/package fault isolation and failure analysis
Prof. Ingrid De Wolf, imec; Dr. Kristof J.P. Jacobs, imec
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