47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
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Dr. Hyuk Ju Ryu
failure analysis engineer
Intel
TD Q&R and Yield
Hillsboro, OR
USA 97124
Papers:
Resistive Open Defect Isolation in Nano-probing
