47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
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Dr. Chuan Zhang
NVIDIA
Silicon Failure Analysis Lab
Santa Clara, CA
USA 95050
Papers:
(V) Backside EBIRCH Defect Localization for Advanced Flip-Chip Failure Analysis
