47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
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Mr. Benhai Zhang
Sr. Engineer
Xilinx
QNG
San Jose, CA
USA 95124
Papers:
Failure Localization Techniques for 7nm & 16nm Process Nodes in Monolithic & 2.5D SSIT Package Technology Using OBIRCH, LVP and Advance Die Thinning Method