47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
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Mr. Kah Chin Cheong
Senior FA Engineer
GLOBALFOUNDRIES Inc.
Malta, NY
USA 12020
Papers:
(V) SAMPLE PREPARATION AND DEVICE DEPROCESSING: Chip Recombination Method in Planar Deprocessing - A Solution for Failure Analysis on Chip Edge Defects