47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
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Mr. Steven B. Herschbein
Consultant
Consultant
Hopewell Junction, NY
USA N/A
Papers:
Focused Ion Beam (FIB) for Microchip Circuit Edit and Fault Isolation
