47th International Symposium for Testing and Failure Analysis (Oct. 31 - Nov. 4, 2021)
October 31 - November 04, 2021
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Dr. Thomas Schwager
Senior Product Manager EBSD
Bruker Nano GmbH
Berlin Germany 12489
Papers:
Recent developments for the characterization of crystals and defects at the nanoscale using on-axis TKD in SEM
