Electrical and Yield I

Sunday, October 31, 2021: 8:00 AM-10:00 AM
104 AB (Phoenix Convention Center)
Mr. Randal E. Mulder, Silicon Labs and Mr. Gregory Johnson, ZEISS Microscopy
8:00 AM
(V) The Fundamentals of Nanoprobe Analysis
Mr. Randal E. Mulder, Silicon Labs
9:00 AM
(V) Machine learning based data and signal analysis methods for the application in failure analysis
Mr. Michael Kögel, Fraunhofer Institute for Microstructure of Materials and Systems IMWS; Dr. Sebastian Brand, Fraunhofer Institute for Microstructure of Materials and Systems IMWS; Mr. Frank Altmann, Fraunhofer Institute for Microstructure of Materials and Systems IMWS
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