Fault Isolation I

Sunday, October 31, 2021: 9:00 AM-2:00 PM
105 AB (Phoenix Convention Center)
Dr. Mayue Xie, Intel corp and Mr. Martin Igarashi, TeraView Limited
9:00 AM
(V) Photonic Localization Techniques
Prof. Christian Boit, Technische Universitaet Berlin
10:00 AM
Morning Refreshment Break
10:20 AM
LADA and SDL: Powerful Techniques for Marginal Failures
Mr. Dan Bodoh, NXP Semiconductors; Mr. Kent Erington, NXP Semiconductors
11:50 AM
Lunch
12:30 PM
FA Technique Selection for Front End Defect Localization in Bulk Semiconductor (Si) FA
Mr. Gregory Johnson, ZEISS Microscopy
See more of: Tutorial
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