Machine learning methods for FEOL/MEOL defects measurement through SRAM bitmap

Tuesday, November 1, 2022: 3:20 PM
Ballroom A (Pasadena Convention Center)
Dr. Ningmu Nathan Zou , AMD, Austin, TX
Mr. Seng Nguon (Raymond) Ting , AMD, Austin, TX
Mr. Adam Rose , AMD, Austin, TX

See more of: AI Application for FA
See more of: Technical Program