INVITED TALK: Failure Analysis Engineering of Semiconductor Lasers
INVITED TALK: Failure Analysis Engineering of Semiconductor Lasers
Wednesday, November 2, 2022: 11:15 AM
Ballroom A (Pasadena Convention Center)
Summary:
Laser module reliability reported abnormal dead/weak emitters at bar level during life test (2530 hours). Hypothesis: A new plan of record (POR) AR mirror coating was the culprit. No catastrophic optical mirror damage (COMD) was observed.
Laser module reliability reported abnormal dead/weak emitters at bar level during life test (2530 hours). Hypothesis: A new plan of record (POR) AR mirror coating was the culprit. No catastrophic optical mirror damage (COMD) was observed.