Case Studies: Device Analysis

Wednesday, November 2, 2022: 10:00 AM-11:40 AM
Ballroom A (Pasadena Convention Center)
* Wireless, Self-Powered, Sensors,
* MEMS Failure Analysis
* Power, Discretes and Optoelectronic Device FA
* Organic Electronic (OLED...)
* Novel memory FA
* Alternative Energy (Photovoltaics, Solid State Lighting, etc.)
* Space Application FA
Mr. Gregory Johnson, ZEISS Microscopy and Yuyan Wang, Texas Instruments
10:00 AM
Simple methods for evaluating junctions in IGBTs
Dr. Vignesh Viswanathan, Carl Zeiss Pte Ltd; Mr. Greg Johnson, ZEISS Microscopy; Andreas Rummel, Kleindiek Nanotechnik; Mr. Jake Jokisaari, Ted Pella; Stewart McCracken, MCS Ltd; Suzanne Costello, MCS Ltd; Aiden M Robinson, MCS Ltd; Andrew Gibson, MCS Ltd; Alan Balfour, MCS Ltd
10:25 AM
Precession Electron Diffraction (PED) Strain Characterization in Stacked Nanosheet FET Structure
Dr. Juntao Li, IBM Research; Dr. Shogo Mochizuki, IBM Research; Dr. Erin Stuckert, IBM Research; Mr. Lukas Tierney, IBM Research; Mr. Kerry Toole, IBM Research; Mr. Rich Conte, IBM Research; Dr. Nicolas Loubet, IBM Research
10:50 AM
Fault Isolation and Physical Failure Analysis of IC-embedded OLED Display Device’s Failure
Mr. Hoseok Song, Samsung Display Co.
11:15 AM
INVITED TALK: Failure Analysis Engineering of Semiconductor Lasers
Mr. Ian M Kearney, TRUMPF Photonics Inc., iDEAL Semiconductor
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