CASE STUDIES: FA PROCESSES - Complementary fault isolation procedures combining Laser Voltage Probing/Imaging and Lock-In Thermography: Case studies

Wednesday, November 2, 2022
Exhibit Halls A & B (Pasadena Convention Center)
Mr. Sukho Lee , NXP Semiconductors, Nijmegen, Netherlands
Dr. Marc van Veenhuizen , NXP Semiconductors, Nijmegen, Netherlands
Mr. Nivesh Rai , NXP Semiconductors, Nijmegen, Netherlands

See more of: Exhibitor Dessert Reception, Poster Session and Video Contest
See more of: Technical Program