48th International Symposium for Testing and Failure Analysis (Oct. 30 - Nov. 3, 2022)
October 30 - November 03, 2022
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Impact of PFIB Gas Assisted Delayering on MOSFET Degradation
Thursday, November 3, 2022: 3:05 PM
Ballroom B (Pasadena Convention Center)
Mr. Zvika Sapir
,
Intel, Haifa, Israel
Mrs. Oksana Dimnich
,
Intel, Haifa, Israel
Dr. Avraham Raz
,
Intel, Haifa, Israel
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