PRODUCT YIELD, TEST AND DIAGNOSTICS: Analysis of Retention Failure by Bulk Trap in DRAM

Wednesday, November 2, 2022

Exhibit Halls A & B (Pasadena Convention Center)

Mr. Dongguk Han , Samsung Electronics, Hwasung, Korea, Republic of (South)

Mr. Hoonchang yang , Samsung Electronics, hwaseong, Korea, Republic of (South)

Mr. Jinyeong Hwang , Samsung Electronics, Hwasung, Korea, Republic of (South)

Mrs. Jinseon Kim , Samsung Electronics, Hwasung, Korea, Republic of (South)

Mr. Kyoungrak Cho , Samsung Electronics, hwaseong, Korea, Republic of (South)

Dr. Incheol Nam , Samsung Electronics, hwaseong, Korea, Republic of (South)

Mr. Daesun Kim , Samsung Electronics Co.,Ltd, Hwaseong City, Korea, Republic of (South)

Mr. Beomseop Lee , Samsung Electronics, Hwasung, Korea, Republic of (South)

Dr. Sungsoo Yim , Samsung Electronics, Hwaseong City, Korea, Republic of (South)

Mr. Heeil Hong , Samsung Electronics, Hwaseong City, Korea, Republic of (South)

Mr. Jooyoung Lee , Samsung Electronics, Hwaseong City, Korea, Republic of (South)