Die-level micrometers-deep subsurface imaging for fault isolation using remote bias induced electrostatic force microscopy

Thursday, November 3, 2022: 11:25 AM
Ballroom A (Pasadena Convention Center)
Dr. Evgheni Strelcov , NIST/GU, Gaithersburg, MD
Dr. Lin You , Micron Technology INC, Boise, ID
Dr. Yaw Obeng , National Institute of Standards and Technology (NIST), Gaithersburg, MD
Mr. Joseph Kopanski , National Institute of Standards and Technology (NIST), Gaithersburg, MD

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