48th International Symposium for Testing and Failure Analysis (Oct. 30 - Nov. 3, 2022)
October 30 - November 03, 2022
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Basics and Current Aspects of Scanning Electron Microscopy
Sunday, October 30, 2022: 8:00 AM
Ballroom C (Pasadena Convention Center)
Dr. Heiko Stegmann
,
Carl Zeiss Microscopy GmbH, Oberkochen, Germany
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Microscopy I & II
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Tutorial