48th International Symposium for Testing and Failure Analysis (Oct. 30

Tutorial

Sunday | Monday | top

Electrical and Yield
Session Chair: Mr. Randal E. Mulder and Mr. Gregory Johnson

Fault Isolation I & II
Session Chair: Mr. Arun Karunanithi and Mr. Joseph Caroselli

Microscopy I & II
Session Chair: Mr. Lorenz Lechner and Ms. Rose Ring

Package and Physical Analysis Challenges I
Session Chair: Ms. Bernice Zee and Ms. Sarah Wozny

Lunch

Package and Physical Analysis Challenges II
Session Chair: Ms. Bernice Zee and Ms. Sarah Wozny

Fault Isolation III
Session Chair: Mr. Arun Karunanithi and Mr. Joseph Caroselli

Technology Specific and Featured I
Session Chair: Mr. John Bescup and Mr. Corey Senowitz

Technology Specific and Featured II
Session Chair: Mr. John Bescup and Mr. Corey Senowitz

Technology Specific and Featured III
Session Chair: Mr. John Bescup and Mr. Corey Senowitz

Technology Specific and Featured IV
Session Chair: Mr. John Bescup and Mr. Corey Senowitz

Sunday | Monday | top

Package and Physical Analysis Challenges III
Session Chair: Mrs. Sarah Wozny and Ms. Bernice Zee