ENVIRONMENTAL X-RAY COMPUTED TOMOGRAPHY (E-CT): 3D CT AT ELEVATED TO CYROGENIC TEMPERATURES

Monday, October 31, 2022: 11:35 AM
Ballroom D (Pasadena Convention Center)
Dr. Thomas Sanders, PhD, Industrial and Systems Engineering, Auburn University 2016; Mast. Materials Eng. Auburn University 2016 , Jet Propulsion Laboratory, Pasadena, CA
Mr. John Bescup , Jet Propulsion Laboratory, Pasadena, CA
Mr. Ryan Ross , Jet Propulsion Laboratory, Pasadena, CA
Mr. Sam Avasapian , Jet Propulsion Laboratory, Pasadena, CA
Mr. Gil Garteiz , Jet Propulsion Laboratory, Pasadena, CA

Summary:

The infusion of new 2.5D and 3D solutions continues to drive advancements in the electronics packaging industry. However, these complex systems pose significant challenges in terms of reliability and qualification. In this paper, we introduce a new technique that may prove valuable for non-destructive, in-situ measurements of package and die warpage, and, subsequently, modelling verification.