Emerging FA Techniques and Concepts

Monday, October 31, 2022: 10:20 AM-12:10 PM
Ballroom D (Pasadena Convention Center)
* New FA tools and methods up to TLR4
* Quantum and neuromorphic circuit FA
* Future Challenges of FA
* FA Techniques addressing the Challenges of Heterogeneous Systems in Package
Mr. Kah Chin Cheong, Samsung Austin Semiconductor and Dr. Baohua Niu, Intel Corp.
10:45 AM
Differential Laser Voltage Probe: A New Approach to a Fundamental Technique
Mr. Kristofor Dickson, NXP Semiconductors; Mr. George Lange, NXP Semiconductors; Dr. Keith Serrels, NXP Semiconductors; Mr. Jose Z. Garcia, NXP Semiconductors; Mr. Kent Erington, NXP Semiconductors; Mr. Dan Bodoh, NXP Semiconductors; Mr. Kee Yang, Checkpoint Technologies; Mr. Jianxun Mou, Checkpoint Technologies
11:10 AM
X-Ray Device Alteration Using A Scanning X-Ray Microscope
Dr. William Lo, NVIDIA; Puneet Gupta, NVIDIA; Rakshith Venkatesh, NVIDIA; Dr. Rudolf Schlangen, NVIDIA; Howard Marks, NVIDIA; Bruce Cory, NVIDIA; Dr. Frances Su, Sigray, Inc.; Dr. Benjamin Stripe, Sigray, Inc.; Ms. Sylvia Lewis, Sigray, Inc.; Dr. Wenbing Yun, PhD, Sigray, Inc.
11:35 AM
ENVIRONMENTAL X-RAY COMPUTED TOMOGRAPHY (E-CT): 3D CT AT ELEVATED TO CYROGENIC TEMPERATURES
Dr. Thomas Sanders, PhD, Industrial and Systems Engineering, Auburn University 2016; Mast. Materials Eng. Auburn University 2016, Jet Propulsion Laboratory; Mr. John Bescup, Jet Propulsion Laboratory; Mr. Ryan Ross, Jet Propulsion Laboratory; Mr. Sam Avasapian, Jet Propulsion Laboratory; Mr. Gil Garteiz, Jet Propulsion Laboratory
12:00 PM
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