High-Resolution Conductivity Mapping with STEM EBIC

Thursday, November 3, 2022: 10:35 AM
Ballroom B (Pasadena Convention Center)
Dr. William A Hubbard, PhD , NanoElectronic Imaging, Inc., Riverside, CA
Mr. Ho Leung Chan , University of California, Los Angeles, Los Angeles, CA
Prof. B.C. Regan , University of California, Los Angeles, Los Angeles, CA

See more of: Microscopy and Material Analysis I
See more of: Technical Program