An innovative technique for large-scale delayering of semiconductor devices with nanometric-scale surface flatness

Tuesday, November 1, 2022: 4:35 PM
Ballroom B (Pasadena Convention Center)
Dr. Pawel Nowakowski , E.A. Fischione Instruments, Inc., Export, PA
Mr. Junhai Lui , E.A. Fischione Instruments, Inc., Export, PA
Mr. Michael F. Boccabella , E.A. Fischione Instruments, Inc., Export, PA
Ms. Mary Ray , E.A. Fischione Instruments, Inc., Export, PA
Mr. Paul Fischione , E.A. Fischione Instruments, Inc., Export, PA

See more of: Sample Preparation and Device Deprocessing
See more of: Technical Program