Zero channel bias determination of device turn-on and the Seebeck effect in nanoprobing
Zero channel bias determination of device turn-on and the Seebeck effect in nanoprobing
Thursday, November 3, 2022: 3:55 PM
Ballroom B (Pasadena Convention Center)
Summary:
A method for determining transistor turn on which does not apply any bias between source and drain is presented
A method for determining transistor turn on which does not apply any bias between source and drain is presented