Newly designed, faster, and more sensitive scanning capacitance microscope for failure analysis

Thursday, November 3, 2022: 11:50 AM
Ballroom A (Pasadena Convention Center)
Dr. Haigang Zhang , Oxford Instruments Asylum research, Santa Barbara, CA
Dr. Marta Kocun , Oxford Instruments Asylum research, Santa Barbara, CA
Dr. Ben Ohler , Oxford Instruments Asylum research, Santa Barbara, CA
Dr. Roger Proksch , Oxford Instruments Asylum research, Santa Barbara, CA

See more of: Scanning Probe Analysis I
See more of: Technical Program