X-Ray Device Alteration Using A Scanning X-Ray Microscope
X-Ray Device Alteration Using A Scanning X-Ray Microscope
Monday, October 31, 2022: 11:10 AM
Ballroom D (Pasadena Convention Center)
Summary:
X-ray device alteration is investigated to determine what role it might play for EFI/EFA of upcoming IC architectures based on buried power rail w/backside power distribution.
X-ray device alteration is investigated to determine what role it might play for EFI/EFA of upcoming IC architectures based on buried power rail w/backside power distribution.