Simple methods for evaluating junctions in IGBTs

Wednesday, November 2, 2022: 10:00 AM
Ballroom A (Pasadena Convention Center)
Dr. Vignesh Viswanathan , Carl Zeiss Pte Ltd, Singapore, CA, Singapore
Mr. Greg Johnson , ZEISS Microscopy, Poughkeepsie, NY
Andreas Rummel , Kleindiek Nanotechnik, Reutlingen, Germany
Mr. Jake Jokisaari , Ted Pella, Redding, CA
Stewart McCracken , MCS Ltd, Edingburgh, United Kingdom
Suzanne Costello , MCS Ltd, Edingburgh, United Kingdom
Aiden M Robinson , MCS Ltd, Edingburgh, United Kingdom
Andrew Gibson , MCS Ltd, Edingburgh, United Kingdom
Alan Balfour , MCS Ltd, Edingburgh, United Kingdom

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