FIB Circuit Analysis and Edit

Thursday, November 3, 2022: 9:25 AM-11:25 AM
Ballroom A (Pasadena Convention Center)
* Advanced Ga-FIB CE tools and workflows
* Helium Ion Microscopy
* New gas chemistries
Ms. Rose Ring, Howard Hughes Research Labs and Dr. Alex Buxbaum, CARL ZEISS INC
9:25 AM
INVITED TALK: Circuit Edit Fundamentals
Dr. David Donnet, Thermo Fisher Scientific; Mr. David Akerson, Thermo Fisher Scientific
9:50 AM
Memory Array Debug strategies using FIB assisted Milling
Mr. Muhammad Usman Raza, Intel; Larry Q. Tran, Intel; Giang-Huong Nguyen, Intel; Danh Tran, Intel; Dennis Tam, Intel; Mr. Richard H. Livengood, Intel Corporation
10:15 AM
Refreshment Break
10:35 AM
Investigation of the Growth Mechanics of Laser Assisted Copper Deposition for Circuit Edit Applications
Dr. Michael DiBattista, Varioscale; Jordan Furlong, Varioscale; Matthew Levesque, Varioscale; Mr. Tom Harper, Varioscale; Dr. Christopher G.L. Ferri, Varioscale; Mr. Scott Silverman, Varioscale; Dr. Nathan Bakken, PhD, Intel Corporation; Mr. Matthew M. Mulholland, Intel Corporation
11:00 AM
Electrical characterization of circuit edit workflow using high and low energy FIB
Mr. Or Haimson, Annapurna Labs Ltd, Amazon; Mr. Roy Goldman, Annapurna Labs Ltd, Amazon; Mr. Michael Wong, Thermo Fisher Scientific
See more of: Technical Program
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