INVITED TALK: Electronic component authenticity via electrical signal measurement and artificial intelligence with deep learning

Tuesday, November 1, 2022: 1:35 PM
Ballroom A (Pasadena Convention Center)
Mr. Yung-Hsiao Chung , Global ETS, Odessa, FL
Mr. Feng Yu , Global ETS, Odessa, FL
Ms. Junjie Xiong , University of South Florida, TAMPA, FL
Prof. Stephen Saddow , University of South Florida, TAMPA, FL, Global ETS, Odessa, FL

Summary:

Global’s Advanced Pin Correlation system is an easy and convenient tool for performing quality conformance and counterfeit IC (integrated circuit) detection based on our deep learning model system using neural networks
See more of: AI Application for FA
See more of: Technical Program