SiP and 3D Devices Failure Analysis

Thursday, November 3, 2022: 9:00 AM-10:35 AM
Ballroom B (Pasadena Convention Center)
Dr. William Lo, NVIDIA Corporation and Dr. Eckhard Langer, Globalfoundries Fab 1
9:00 AM
Electronics Failure Analysis Demonstrations using a Quantum Diamond Microscope
Dr. Pauli Kehayias, Sandia National Labs; Dr. Edlyn V. Levine, Harvard University; Dr. Andrea Rodarte, Sandia National Labs; Mr. Jeremy A. Walraven, Sandia National Labs; Dr. Andrew Mounce, Sandia National Labs
9:25 AM
3D Power Module Packages – Failure Analysis Challenges & How to Overcome Them
Mr. Mirza Imran Baig, Texas Instruments
9:50 AM
Break
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