Electrical and Yield

Sunday, October 30, 2022: 8:00 AM-10:00 AM

Ballroom A (Pasadena Convention Center)

Mr. Randal E. Mulder, Silicon Labs and Mr. Gregory Johnson, Carl Zeiss Microscopy

8:00 AM

Yield Basics for Failure Analysis
Mr. David Albert, IBM (Retired); Mr. Tracy Myers, ON Semiconductor

9:00 AM

The Fundamentals of Nanoprobe Analysis
Mr. Randal E. Mulder, Silicon Labs

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