Fault Isolation I & II

Sunday, October 30, 2022: 8:00 AM-1:20 PM
Ballroom B (Pasadena Convention Center)
Mr. Arun Karunanithi, Advanced Micro Devices, Inc. and Mr. Joseph Caroselli, Advanced Micro Devices, Inc.
8:00 AM
Defect localization by Lock-In-Thermography
Dr. Sebastian Brand, Fraunhofer Institute for Microstructure of Materials and Systems
9:00 AM
Photonic Localization Techniques
Prof. Christian Boit, Technische Universitaet Berlin
10:00 AM
Refreshment Break
10:20 AM
LADA and SDL: Powerful Techniques for Marginal Failures
Mr. Dan Bodoh, NXP Semiconductors; Mr. Kent Erington, NXP Semiconductor
11:20 AM
FA Technique Selection for Front End Defect Localization in Bulk Semiconductor (Si) FA
Mr. Gregory Johnson, ZEISS Microscopy
12:20 PM
Lunch
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