OFI / TEST / DIAGNOSIS USER GROUP

Thursday, November 3, 2022: 12:30 PM-1:30 PM
Ballroom D (Pasadena Convention Center)
OFI / TEST / DIAGNOSIS

The Optical Fault Isolation, Test, and Diagnosis User Group will include discussions on a variety of topics related to optical probing techniques for fault isolation as well as test and diagnosis.

The format will be open discussion with mini-presentations on predetermined topics with opportunities for audience participation.

Examples of discussion topics include:

  • Laser-based techniques
  • Lock-in Thermography
  • Backside E-beam probing
  • FA testers
Mr. Dan Bockelman, Intel and Mr. Neel Leslie, Thermo Fisher Scientific
12:30 PM
OFI / TEST / DIAGNOSIS USER GROUP & LUNCH
See more of: Technical Program
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