Scanning Probe Analysis II

Thursday, November 3, 2022: 1:40 PM-2:05 PM
Ballroom A (Pasadena Convention Center)
Mr. Paiboon Tangyunyang, Sandia Labs and Mr. Phil Kaszuba, Globalfoundries
1:40 PM
AFM in SEM for device characterization and defect localization
Mr. Gregory Johnson, ZEISS Microscopy; Dr. Frank Hitzel, DoubleFox GmbH
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