49th International Symposium for Testing and Failure Analysis (Nov. 12 – Nov. 16, 2023)
November 12 - 16, 2023
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TEM Techniques for Semiconductor Failure Analysis
Sunday, November 12, 2023: 10:20 AM
105 ABC (Phoenix Convention Center)
Dr. Sam Subramanian
,
NXP Semiconductors, Austin, TX
Mr. Jacob Levenson
,
NXP Semiconductors, Austin, TX
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Microscopy Tutorial II
See more of:
Tutorial